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Oxford Instruments

Ion Beam 300

EtchOxford Instruments Ion Beam family
Research Quality: 40% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

Ion Beam 300 — Inventory photo
Fig. 01Ion Beam 300Inventory photo[1]

What it is

The Oxford Instruments Ion Beam 300 is an ion beam etch system.[1][2]

How it works

General reference — not yet source-verified

An ion beam etch system removes material by directing a beam of ions at a surface to sputter or mill exposed areas.

An ion beam etcher is a vacuum process tool that uses directional bombardment rather than wet chemistry to shape thin films and patterned layers.

Where it fits in the process flow

General reference — not yet source-verified

Ion beam etching is used when directional material removal and controlled profile transfer are needed in microfabrication flows.

Applications

General reference — not yet source-verified

Ion beam etch systems are used for precision material removal on patterned surfaces.

Ion beam etching is commonly applied to thin films and other layers that benefit from anisotropic removal.

Why won't it start?

Documented failure modes, common issues, and field considerations.

  • has some PLC errors

What do the numbers mean?

Wafer handling1

Wafer size
4 inch[1]
Accurate?

Control & software1

has some PLC errors[1]
Accurate?

Configuration & options2

Category
Etch[2]
Accurate?
Vintage
2007[1]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Not publicly documented

The following facts about the Ion Beam 300 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Ion Beam 300 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Ion Beam 300 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Ion Beam 300 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • The process node or technology generation of the Ion Beam 300 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly documented compatible parts, consumables, or accessories for the Ion Beam 300 are on record.

    Answerable by: an OEM parts catalog or a service engineer

Sources & citations

Sources (2)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]waferpedia.com — waferpedia.comwaferpedia.com
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Last updated Oct 6, 2026.

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