Lam Research
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The Lam Research 2300 Exelan is a dielectric etch system for 300mm wafers. The 2300 Exelan demonstrated capability for sub-65-nm front- and backend applications, including HARC and dual damascene processes.[1]
The Lam Research 2300 Exelan is a dielectric etch system designed for 300 mm (12-inch) wafers.[2]
The 2300 Exelan uses Dual Frequency Confined (DFC) plasma technology. DFC provides two independent radio-frequency sources for process flexibility. The plasma is confined within the chamber to eliminate memory effects. The system includes in situ Waferless AutoCleans to maintain chamber cleanliness between wafers.[4][1]
The system targets critical dielectric etch applications for advanced logic and memory devices. Dielectric etch processes define contact holes, via openings, and trench patterns in insulating layers.
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The 2300 Exelan supports 300 mm (12-inch) wafers.[2]
The system uses Dual Frequency Confined (DFC) plasma technology.[4][1]
The following facts about the 2300 Exelan Dielectric are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the 2300 Exelan Dielectric are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the 2300 Exelan Dielectric are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the 2300 Exelan Dielectric are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the 2300 Exelan Dielectric are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the 2300 Exelan Dielectric is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Sep 22, 2026.
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