KLA
The KLA P-16+ Profiler is a stylus-based surface profiler for step height, roughness, waviness, and stress measurements. The KLA P-16+ Profiler offers a vertical range of 327 µm and supports wafer sizes from 2 to 12 inches.[1][2]

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The KLA P 16 + supports wafer sizes of 2, 3, 4, 5, 6, 8, and 12 inch.[2]
The vertical range of the P 16 + is 327 micrometers.[2]
The P 16 + has a fully motorized X-Y-Z, theta, and level stage, and its stylus has a radius of 2 micrometers with a 60-degree cone angle.[2]
Yes, the P 16 + is used for CMP monitoring and bump metrology applications.[1]
The following facts about the P 16 + Profiler are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the P 16 + Profiler are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the P 16 + Profiler are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the P 16 + Profiler are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the P 16 + Profiler are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the P 16 + Profiler is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Sep 25, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.