KLA

The KLA 200 series is a pattern inspection station used for reticle and photomask inspection.

The KLA FT-750 is a visible light spectrophotometer-based thin film measurement system for semiconductor process control.

The KLA AlphaStep D-300 is a stylus-based surface profiler that measures step heights from 50 nm to 300 µm.

KLA PN: 29 0177 Window, Lamp House is a fused silica part stated to be capable of working on KLA UV 1xy0.

KLA F 60 is a film thickness measurement tool used in semiconductor metrology and inspection.

The KLA 1.112 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 inspection systems.

The KLA SLF 17 is an inspection system.

KLA Candela CS 2 Surface is a metrology and inspection tool described as a surface inspection system and surface analyzer.

The KLA Archer 300 is an overlay metrology system for optical overlay measurements on 300mm wafers.

The KLA 8100 XP is a critical dimension scanning electron microscope (CD-SEM) designed for automated CD measurements on silicon wafers and reticles, featuring production-proven electron optics for bottom imaging of high aspect ratio structures.

The KLA Surfscan SP 1 is a wafer inspection tool from KLA-Tencor used for defect detection and surface quality inspection on polished wafers, epi wafers, and engineered substrates.

The KLA Alpha Step D 500 Wafer Profiler Meter is a stylus profiler for 2D step height measurement, roughness, bow, and stress metrology.

The KLA Tencor D600 is a stylus surface profiler for thin and thick film step height measurement.

KLA Surfscan 6 XY 0 Training is an equipment entry identified by model Surfscan 6 XY 0.

The KLA Inspex Eagle Tester is a wafer handling and inspection system with 6-inch chuck and prealigner, 4-inch to 8-inch wafer capability, cassette-to-cassette handling, two ports, and a Zeiss microscope.

The KLA P 16 Surface is a surface profilometer described as a fully refurbished unit with Windows XP, extended range up to 1 mm, and a 3D option.

The KLA Surfscan SP 1 TBI Keyboard is a keyboard-only replacement part for the KLA Surfscan SP 1 TBI system.

The KLA Surfscan SP 1 Classic Particle Defect System is a particle defect inspection system for 6-inch and 8-inch wafers.

KLA P 16 + Profiler is a metrology and inspection tool with listed wafer sizes from 2 inch to 12 inch.

The KLA Surfscan 7700 is a particle defect inspection system.

The KLA Candela CS 10 R Wafer Inspector is a single-phase wafer inspector with a 50/60 Hz, 5 A power specification and a booting upgrade requirement.

The KLA / Therma-wave TP 500 is an implant dose measurement tool used in ion implantation.

The KLA SCD 100 is a film thickness measurement tool.

The KLA 5100 Overlay Measurement System is an overlay measurement system with an 8-inch wafer size.

The KLA PCA 54.0294 Turret Servo Driver is a turret servo driver manufactured by KLA under the model designation PCA 54.0294.

KLA model 215-0591 is a Power Adapter.

The 215-0509 Power Adapter is a power adapter listed by KLA Instruments.

The KLA 4PP-TypeA is a four-point probe.

The Counterweight-10x/20xNikonDI is a product offered by KLA Instruments. The product is listed in the KLA Instruments collection. No technical specifications are provided in the source.

The KLA 4PP-TypeI is a resistance probe product listed in the KLA Instruments product collection.

The KLA 4PP-TypeD is a resistance probe product listed in the KLA Instruments online store.

The Counterweight-50x-100xNikonDI is a KLA Instruments spare part listed in the KLA Instruments online store.

The KLA Candela 8520 Surface is a surface inspection system for wafer inspection on 6-inch and 8-inch wafers.

The KLA CondWafer-4PP is a product listed in the KLA Instruments online store.

The KLA Surfscan SP 5 Particle Defect System is a bare wafer inspection station configured for 12-inch wafers.

The KLA Surfscan SP 3 Particle Defect System is a bare wafer inspection station for 12-inch wafers with DUV illumination.

KLA eV 300 is an advanced, fully automated scanning electron microscope defect review tool for manufacturing environment use.

The KLA-Tencor Omnimap RS55/TC is a semiconductor equipment manufactured by KLA-Tencor and supports 8-inch wafers.

The KLA Aleris HX 8500 is an ellipsometry measurement tool introduced in 2008.

The KLA 2350 is an inspection system.

The KLA 6220 is a particle inspection and bare wafer surface defect inspection system.

The KLA 1007 is a wafer prober manufactured by KLA.

The KLA / MicroSense UMSC 200 BT Measurement System is a non-contact measurement system for flatness and thickness measurement.

The KLA 7600 Patterned Wafer Particle Defect is a metrology and inspection system configured for a 25 Wafer Slot Cassette.

The KLA HRP 220 Surface is a surface profilometer.

The KLA Puma 9120 is a dark-field defect detection tool for semiconductor wafer inspection. The KLA Puma 9120 is configured for 200 mm and 300 mm wafers and has two cameras.

The KLA / Filmetrics F 80 c 300 is a film thickness measurement tool.

KLA P-7 is a research grade stylus profiler for surface metrology and measurement.

The KLA Filmetrics F40 is a microscope-based thin-film measurement instrument that uses spectral reflectance technology to measure thickness and optical constants.

The Leica ACE 600 is a high vacuum coating system for electron microscopy sample preparation, equipped with a configurable metal process chamber and multiple coating sources.

The KLA Candela CS 20 R is a metrology and inspection system for wafer inspection.