Waferpedia

Zeiss

Axio CSM 700

Metrology & InspectionZeiss Axio family
Research Quality: 50% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

The Zeiss Axio CSM 700 is a confocal microscope for three-dimensional surface topography measurement. The Zeiss Axio CSM 700 offers a motorized scanning stage with a 150 x 150 mm travel range. The Zeiss Axio CSM 700 performs topographical measurements at a rate of more than 100 frames per second.[1]

Axio CSM 700 — Inventory photo
Fig. 01Axio CSM 700Inventory photo[2]

What it is

The Zeiss Axio CSM 700 is a confocal microscope used for surface metrology and inspection. The Axio CSM 700 is a Zeiss instrument in the Axio CSM 700 model line.[2][1]

The Axio CSM 700 is intended for measuring and visualizing surface topography on large sample areas. The Axio CSM 700 is suited to materials research, quality inspection, and routine applications.[1]

How it works

The Axio CSM 700 visualizes surfaces three-dimensionally in true color. The Axio CSM 700 performs topographical measurements for surface roughness and related microstructure analysis.[1]

The Axio CSM 700 includes a motorized scanning stage. The Axio CSM 700 integrates stage control into its software and includes a Mosaic function for stitching large sample areas.[1]

Where it fits in the process flow

The Axio CSM 700 is used for large-area measurement in applications where roughness, wear, layer thickness, and particle analysis are relevant. The Axio CSM 700 supports routine evaluation of manufactured surfaces and materials.[1]

Applications

The Axio CSM 700 is used in materials research, quality inspection, and routine applications. The Axio CSM 700 is used for precise measurement of three-dimensional microstructures and surface roughness.[1]

The Axio CSM 700 supports roughness measurement, layer thickness evaluation, and particle analysis. The Axio CSM 700 also supports measurement of wear rate and other surface parameters on large sample areas.[1]

What do the numbers mean?

Optics & imaging1

Step height measurement range
20 nm up to the millimetre range[1]
Accurate?

Control & software3

with controller[2]
Accurate?
Software analysis options
Measurement of roughness, evaluation of layer thickness, particle analysis[1]
Accurate?
Imperial units integration
Inches and microinches integrated into software[1]
Accurate?

Dimensions & facilities1

Depth of focus
Previously only offered by scanning electron microscopes (SEMs)[1]
Accurate?

Configuration & options4

Microscope type
Confocal microscope[1]
Accurate?
Scanning stage travel range
150 x 150 mm[1]
Accurate?
Measurement rate
More than 100 frames per second[1]
Accurate?
Mosaic function
Captures large sample areas with a stitching algorithm that eliminates transitions in the final image[1]
Accurate?
Interested in this tool?
Need help with this tool?Embed spec card

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

No research found yet — worked with this tool? Share what you know.

Worked with this tool? Help preserve its knowledge →

Not publicly documented

The following facts about the Axio CSM 700 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Axio CSM 700 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Axio CSM 700 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Axio CSM 700 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Axio CSM 700 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Axio CSM 700 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

No research found yet — worked with this tool? Share what you know.

Sources & citations

Sources (2)Every fact above is drawn from these public sources
  1. [1]selectscience.net — selectscience.netselectscience.net
  2. [2]Inventory photo
Was this page accurate?

Last updated Oct 9, 2026.

Compare with similar tools

View all →