Thermo Fisher
Scientific FEI NanoLab 230
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
The Thermo Fisher Scientific FEI NanoLab 230 is a scanning electron microscope (SEM) developed by FEI Company, now part of Thermo Fisher Scientific.[1]
How it works
General reference — not yet source-verifiedA scanning electron microscope generates a beam of electrons from an electron gun, typically a thermionic or field-emission source. The beam is focused and deflected by electromagnetic lenses to scan the sample surface in a raster pattern.
As the primary electron beam interacts with the sample, it produces various signals, including secondary electrons, backscattered electrons, and characteristic X-rays. Detectors collect these signals to form images or perform elemental analysis.
Applications
General reference — not yet source-verifiedWith dual-beam capability, it is used for preparing transmission electron microscopy samples, performing site-specific cross-sections, and conducting material analysis via energy-dispersive X-ray spectroscopy or electron backscatter diffraction.
What do the numbers mean?
Configuration & options3
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Not publicly documented
The following facts about the Scientific FEI NanoLab 230 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Scientific FEI NanoLab 230 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Scientific FEI NanoLab 230 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Scientific FEI NanoLab 230 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Scientific FEI NanoLab 230 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Scientific FEI NanoLab 230 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (1)Every fact above is drawn from these public sources
- [1]Inventory photo
Last updated Oct 7, 2026.
Compare with similar tools
View all →The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.
