Nextest Magnum 2 EV

The Teradyne Nextest Magnum 2 EV is a low-power standalone engineering test system designed for automated semiconductor memory testing, program development, and debugging. The Magnum 2 EV is a 128-channel memory tester.^[1]

The Magnum 2 EV is an automated test equipment (ATE) memory tester for 300mm wafer-level testing. The system uses a Magnum EV chassis and can be configured with up to 1024 channels.^[2]

The Magnum 2 EV provides vector performance through a full Algorithmic Pattern Generator (APG) with Topo Scrambling and Logic Vector Memory (LVM) configurations per pin. Hardware acceleration is built with a Dual Bank Error Catch Ram (ECR) system paired with an automated RA processor. The tester features fully independent data-per-pin architectures to handle high-speed IC verification. The system typically runs native Nextest Windows-based diagnostic software utilities, such as Ui.exe environments, for test sequencing and real-time failure analysis.^[1]

The Site Assembly Board architecture offers 128 tester channels that can be connected to a device under test (DUT) or multiple DUTs. The system can be configured to use up to 40 Site Assembly Boards, resulting in a tester with up to 5120 channels.^[1]

Each site assembly provides 128 digital test pins, translating to 512 digital test pins per site assembly. Each site assembly supports up to 128 device power supplies (DPS) and up to 128 high voltage pins. Each site includes 8 parametric measurement units.^[2]

Memory testers also support engineering characterization and program development during earlier stages of product qualification. The test data from such systems informs yield analysis and process improvement.

Typical applications include final test of DRAM, SRAM, and non-volatile memory (NVM) devices such as flash memory. The system can also be employed for device characterization and reliability testing.