LTX-Credence
DiamondX
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The LTX-Credence DiamondX is a test & probe ATE tester. The LTX-Credence DiamondX was selected for microcontroller device testing in a 65nm process. The LTX-Credence DiamondX base system can include a 20-slot test head.[1][2]
What it is
General reference — not yet source-verifiedThe LTX-Credence DiamondX is a semiconductor test-and-probe system.
Where it fits in the process flow
General reference — not yet source-verifiedA test-and-probe tool belongs in the semiconductor test flow at the stage where devices are electrically exercised and sorted before later downstream handling.
What do the numbers mean?
Power & electrical3
- 50/60 Hz[2]
Vacuum & pumping1
Wafer handling1
Performance1
Control & software1
Configuration & options12
- 50A[2]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the DiamondX are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the DiamondX are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the DiamondX are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the DiamondX are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the DiamondX are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the DiamondX is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (5)Every fact above is drawn from these public sources
- [1]TI selects LTX-Credence Diamondx tester for microcontroller device testing | Electronic Specifier — electronicspecifier.comelectronicspecifier.com
- [2]Inventory photo
- [3]waferpedia.com — waferpedia.comwaferpedia.com
- [4]semi-sps.comsemi-sps.com
- [5]LTX-Credence — arm-dnikogho-d1.ltxc.com (Mar 30, 2013)web.archive.org
Last updated Oct 9, 2026.
