Comparison ledger
KLA 1007, LTX-Credence DiamondX, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | DiamondXLTX-Credence |
|---|---|---|
| OEM | KLA | LTX-Credence |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | LTX-Credence DiamondX |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | ATE[5] |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Configuration | — | 50/60 Hz[3] |
| Category | — | Test & Probe[4] |
| Test head | — | 20 slot[3] |
| Power | — | 50/60 Hz[3] |
| Current | — | 50A[3] |
| Power distribution unit | — | 400 VAC nominal[3] |
| Digital vector option | — | GX1x Digital 192ch 50MHz vector rate 18M Vect[3] |
| Precision V/I source | — | VIS16 16ch[3] |
| Utility board | — | SDU System & DUT Utility Board[3] |
| Scan option | — | DPIN96[3] |
| DSP send/receive option | — | DPIN96 DSP Send/Receive option[3] |
| Monitor | — | Standard 22 inch LCD monitor[3] |
| Handler interface | — | Parallel/TTL handler interface card for CPU[3] |
| Noise reduction | — | Exhaust baffle for audible noise reduction[3] |
| Emergency stop | — | Remote emergency shutdown button (EMO)[3] |
| Multimeter | — | 3446 1/2 digit multimeter, external[3] |
| System interface | — | Systems Test Interface[3] |
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