KLA
UV 1250 SE Thin Film Thickness Measurement
Where it fits in the process flow
Applications
The KLA UV 1250 SE Thin Film Thickness Measurement is used for thin-film thickness measurement on wafers.[4]
What do the numbers mean?
Wafer handling4
Control & software6
Configuration & options10
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What software and firmware versions does the KLA UV 1250 SE use?
The system runs Windows NT software version 4.0.1381, Summit software version 2.62.06, and tester firmware version 3.1.0.[4]
What is the wafer handling configuration of the KLA UV 1250 SE?
The system uses an open cassette configuration for wafer handling.[4]
Not publicly documented
The following facts about the UV 1250 SE Thin Film Thickness Measurement are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the UV 1250 SE Thin Film Thickness Measurement are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the UV 1250 SE Thin Film Thickness Measurement are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the UV 1250 SE Thin Film Thickness Measurement are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the UV 1250 SE Thin Film Thickness Measurement are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the UV 1250 SE Thin Film Thickness Measurement is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (4)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Equipment inventory listing
- [4]waferpedia.com — waferpedia.comwaferpedia.com
Last updated Oct 12, 2026.
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