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KLA

Candela CS 20 V Surface Analyzer

CMP2"KLA Candela CS 20 family
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The KLA Candela CS 20 V Surface Analyzer is a non‑destructive, laser‑based surface inspection and metrology system. The Candela CS 20 V uses a 405 nm violet laser (25 mW) to measure film thickness, detect particles as small as 0.08 µm, and identify surface defects such as scratches, pits, bumps, and stains. The Candela CS 20 V handles wafers from 2 to 8 inches and provides vertical topography resolution of 1 Å.[1][2]

Candela CS 20 V Surface Analyzer — Inventory photo
Fig. 01Candela CS 20 V Surface AnalyzerInventory photo[3]

Wafer size

2"

Power

230 VAC 50/60 Hz[2]

Optics

Violet Laser (405nm, 25mW)[5]

What it is

The KLA Candela CS 20 V Surface Analyzer is an optical surface metrology system for wafer inspection and measurement.[5][1][2]

The Candela CS 20 V belongs to the class of non-contact wafer surface analyzers used to examine film thickness uniformity, surface defects, and surface topography.[1][2]

How it works

The Candela CS 20 V uses a laser-based optical system and supports scattered light, specular reflection, phase shift, and surface topography detection modes.[1]

The Candela CS 20 V performs cassette-to-cassette wafer handling with automatic robotic transfer.[1][2]

Where it fits in the process flow

The Candela CS 20 V fits in wafer inspection and metrology flows after surface-relevant process steps that require checking film uniformity, particles, scratches, stains, pits, bumps, roughness, or waviness.[1]

The Candela CS 20 V handles semiconductor and related optoelectronic materials, including wafers with diameters from 2 inch to 8 inch.[2][1]

Applications

The Candela CS 20 V is used for film thickness uniformity analysis, particle detection, surface defect detection, and surface topography measurement.[1]

The Candela CS 20 V is used to detect scratches, stains, pits, bumps, micro-roughness, and waviness.[1]

The Candela CS 20 V uses a violet laser at 405 nm with 25 mW power and a spot size of 5 × 6 µm.[1][5]

What do the numbers mean?

Power & electrical2

Power supply
230 VAC 50/60 Hz[2]
Accurate?
Model
Candela CS 20 V[5]
Accurate?

Wafer handling12

Wafer size
Wafer Handling: - Sizes: 2", 3", 4", 5", 6", 8" - Thickness: 0.2–1.1 mm - Automatic robotic transfer - Cassette-to-cassette operation[1]
Accurate?
Down to 0.08 µm (PSL equivalent) - ≥95% detection rate (on polished wafers)[1]
Accurate?
Wafer sizes supported
2", 3", 4", 5", 6", 8"[1]
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Wafer thickness range
0.2–1.1 mm[1]
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Particle detection rate
≥95% on polished wafers[1]
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Wafer handling
Automatic robotic transfer, cassette-to-cassette[1]
Accurate?
Wafer sizes
2", 3", 4", 5", 6", 8"[1]
Accurate?
Particle detection rate (polished wafers)
≥95%[1]
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Wafer sizes
6 inch[5]
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Wafer sizes
2", 3", 4", 5", 6", 8 inch[1]
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Wafer handling
Automatic robotic transfer; Cassette-to-cassette operation[1]
Accurate?
Particle detection
Down to 0.08 µm (PSL equivalent); ≥95% detection rate (on polished wafers)[1]
Accurate?

Optics & imaging8

Violet Laser (405nm, 25mW)[5]
Accurate?
Optical System:[1]
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Phase
Laser: 405 nm, 25 mW diode - Spot size: 5 × 6 µm Detection modes: - Scattered light - Specular reflection - Phase shift - Surface topography[1]
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Laser wavelength
405 nm[1]
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Laser power
25 mW[1]
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Topography vertical resolution
1 Å[1]
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Laser
405 nm, 25 mW diode[1]
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Vertical resolution
1 Å[1]
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Control & software2

Operating system
Windows XP[2]
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Control system
Windows XP operating system[2]
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Dimensions & facilities6

Scratch detection dimensions
Length: 100 µm, Width: 0.1 µm, Depth: 50 Å[1]
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Pit/Bump detection dimensions
Diameter: 20 µm, Depth: 50 Å[1]
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Stain detection dimensions
Diameter: 20 µm, Film thickness: 10 Å[1]
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Scratch detection minimum width
0.1 µm[1]
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Scratch detection minimum depth
50 Å[1]
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Pit/Bump detection minimum depth
50 Å[1]
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Configuration & options12

Particle Detection:[1]
Accurate?
Spot size
5 × 6 µm[1]
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Detection modes
Scattered light, specular reflection, phase shift, surface topography[1]
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Particle detection threshold
0.08 µm (PSL equivalent)[1]
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Cleanroom environment
Internal class 10[2]
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Particle detection minimum size
0.08 µm (PSL equivalent)[1]
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Scratch detection minimum length
100 µm[1]
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Pit/Bump detection minimum diameter
20 µm[1]
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Stain detection minimum diameter
20 µm[1]
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Stain detection minimum film thickness
10 Å[1]
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Vintage
2012[5]
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Make
KLA[5]
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Vintage & configurations

Documented models & variants

DesignationGenerationVintageChangesSource
Candela CS 20 V———Equipment inventory listing[5]
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Power supply230 VAC 50/60 Hz[2]
  • ModelCandela CS 20 V[5]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What wafer sizes does the Candela CS 20 V handle?

The Candela CS 20 V handles 2 inch, 3 inch, 4 inch, 5 inch, 6 inch, and 8 inch wafers.[1]

What inspection functions does the Candela CS 20 V provide?

The Candela CS 20 V provides film thickness uniformity analysis, particle detection, surface defect detection, and surface topography measurement.[1]

What optical system does the Candela CS 20 V use?

The Candela CS 20 V uses a 405 nm, 25 mW diode laser with a 5 × 6 µm spot size.[1][5]

Not publicly documented

The following facts about the Candela CS 20 V Surface Analyzer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Candela CS 20 V Surface Analyzer are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • The control-system platform and OS era of the Candela CS 20 V Surface Analyzer are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Candela CS 20 V Surface Analyzer are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Candela CS 20 V Surface Analyzer is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly documented compatible parts, consumables, or accessories for the Candela CS 20 V Surface Analyzer are on record.

    Answerable by: an OEM parts catalog or a service engineer

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Sources & citations

Sources (5)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]semistarcorp.com — semistarcorp.comsemistarcorp.com
  3. [3]Inventory photo
  4. [4]Inventory photo
  5. [5]inventory listing
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Last updated Oct 11, 2026.

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