Hitachi
SFT 9550 X Fluorescence X-ray Film Thickness Meter
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
What it is
Where it fits in the process flow
General reference — not yet source-verifiedXRF film thickness meters are used in semiconductor fabrication and other thin-film industries for non-destructive metrology after deposition processes such as physical vapor deposition, electroplating, or electroless plating. The measurement step typically occurs after the film is deposited and before further processing, providing feedback for process control. Downstream steps may include etching or patterning that rely on known film thickness.
Applications
General reference — not yet source-verifiedCommon applications of XRF film thickness meters include measuring the thickness of metal films such as gold, nickel, copper, tin, and solder alloys on substrates like silicon wafers, ceramic packages, or printed circuit boards. The technique is also used for composition analysis of alloy films and for quality assurance in plating lines. In semiconductor packaging, XRF is employed to measure under-bump metallization and lead-free solder thickness.
What do the numbers mean?
No specifications recorded yet
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Where are the manuals?
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Not publicly documented
Field notes
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Not publicly documented
The following facts about the SFT 9550 X Fluorescence X-ray Film Thickness Meter are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No specifications for the SFT 9550 X Fluorescence X-ray Film Thickness Meter are on record.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the SFT 9550 X Fluorescence X-ray Film Thickness Meter are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the SFT 9550 X Fluorescence X-ray Film Thickness Meter are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the SFT 9550 X Fluorescence X-ray Film Thickness Meter are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the SFT 9550 X Fluorescence X-ray Film Thickness Meter are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
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Sources & citations
Sources (2)Every fact above is drawn from these public sources
- [1]Equipment inventory listing
- [2]SFT 9550 X Fluorescence X-ray Film Thickness Meter — Hitachi | Specs, Sourcing & Service | Waferpedia — waferpedia.comwaferpedia.com
Last updated Oct 7, 2026.
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