Teradyne
J 750 S
The Teradyne J 750 S is a tester. The Teradyne J 750 S operates on 3 Phase 3 Wire + PE, 30 A, 50/60 Hz, 208 Vac.[1][2][3][4][5]
What it is
How it works
General reference — not yet source-verifiedA semiconductor tester applies electrical signals to a device under test and measures the resulting responses to verify function and parametric behavior.
A test system of this class typically interfaces with the device through a probe or other contact method before final assembly.
Where it fits in the process flow
General reference — not yet source-verifiedThe Teradyne J 750 S belongs in the test and probe portion of semiconductor manufacturing.
A tester in this class is used after wafer-level fabrication steps and before final package-level qualification.
Applications
General reference — not yet source-verifiedThe Teradyne J 750 S is used for wafer-level electrical test in semiconductor production.
The Teradyne J 750 S is suited to checking integrated circuits and other semiconductor devices that require probe-based evaluation.
What do the numbers mean?
Power & electrical6
- 50/60 Hz[1]
Configuration & options6
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Advantest 93000 Smart Scale— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- LTX-Credence ASL 1000— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Advantest 93000 SOC— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- LTX-Credence ASL 3000— Same function class: Test & Probe, UnknownCompare in depthsource[1]
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the J 750 S are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the J 750 S are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the J 750 S are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the J 750 S are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the J 750 S are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the J 750 S is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (6)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Equipment inventory listing
- [5]Equipment inventory listing
- [6]Equipment inventory listing
Last updated Oct 8, 2026.
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The Advantest 93000 Smart Scale Tester is a semiconductor test system that includes a Z640 workstation and can be configured with STH or CTH thermal heads and various card types.
The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.
The LTX / Credence ASL 1000 is an integrated-circuit tester commonly configured with an Electroglas EG 4090 prober for 8-inch wafers.
