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Teradyne

J 750 LitePoint

Test & ProbeTeradyne J 750 LitePoint family
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The Teradyne J 750 LitePoint is an RF tester. The J 750 LitePoint is part of the J750 family of test systems.[1][2]

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What it is

General reference — not yet source-verified

An RF tester is a semiconductor test system used to apply electrical stimulus, measure device response, and sort parts by test results. The J 750 LitePoint belongs to the class of automated test equipment used for production semiconductor testing.

How it works

General reference — not yet source-verified

An RF tester typically routes signals through test resources, compares measured behavior against limits, and records pass or fail outcomes for each device under test. A production tester of this class usually combines instrumentation, control software, and interface resources for repeated device insertion and measurement.

Where it fits in the process flow

General reference — not yet source-verified

The J 750 LitePoint fits in semiconductor test and probe operations. The equipment class is used after wafer fabrication steps that require electrical verification of devices before downstream sorting or assembly.

Probe-based test systems connect to devices through a wafer probe interface during test insertion. The tester measures device behavior at that stage and supports classification of parts for later processing.

What do the numbers mean?

Configuration & options6

2x HSD100 - 128 ch[1]
Accurate?
2x DPS - 16 DPS[1]
Accurate?
TERA1[1]
Accurate?
8 Slot Body[1]
Accurate?
Asset #
72580[1]
Accurate?
2x HSD100 - 128 ch - 2x DPS - 16 DPS - TERA1 - 8 Slot Body[1]
Accurate?
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Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

How does the tester interface with the device under test?General reference — not yet source-verified

The tester connects to the device through a test head that contains pin electronics. For wafer-level testing, a probe card makes contact with the die; for packaged devices, a test socket is used. The interface allows high-speed signal delivery and accurate measurement.

What is the typical test flow when using such a system?General reference — not yet source-verified

The typical test flow begins with loading the test program, which defines the stimuli and limits. The DUT is contacted, tests are executed (e.g., functional, parametric, and at-speed tests), and results are logged. Devices that pass proceed to the next process step; failures are binned for analysis or discard.

What are the main advantages of using automated test equipment of this class?General reference — not yet source-verified

The main advantages include high test accuracy and repeatability, ability to test complex mixed-signal functionality, high throughput for volume production, and flexible reconfiguration for different device types through software.

Not publicly documented

The following facts about the J 750 LitePoint are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the J 750 LitePoint are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the J 750 LitePoint are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the J 750 LitePoint are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the J 750 LitePoint are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the J 750 LitePoint is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]Archimedes Analytics Solutions | Teradyne — teradyne.com (May 30, 2023)web.archive.org
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Last updated Oct 3, 2026.

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