Teradyne
J 750 EX
The Teradyne J 750 EX is a tester manufactured by Teradyne.[1]
What it is
How it works
General reference — not yet source-verifiedThe J 750 EX operates by applying electrical test signals to semiconductor devices through a test head and measuring their responses.
Where it fits in the process flow
General reference — not yet source-verifiedThe J 750 EX is used after wafer fabrication to test the electrical functionality of individual semiconductor die before packaging.
The system can also be used for final test of packaged integrated circuits.
Applications
The J 750 EX is used for testing digital and mixed-signal semiconductor devices.[7]
What do the numbers mean?
Configuration & options9
Vintage & configurations
What replaced it?
Alternatives
Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.
- Advantest 93000 Smart Scale— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- LTX-Credence ASL 1000— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- Advantest 93000 SOC— Same function class: Test & Probe, UnknownCompare in depthsource[1]
- LTX-Credence ASL 3000— Same function class: Test & Probe, UnknownCompare in depthsource[1]
Parts & consumables
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
What type of test system is the J 750 EX?
It is a production board test system used in electronics manufacturing test.[7]
Does the named production board test family include in-circuit test?
Yes. The family includes in-circuit testing.[7]
Does the named production board test family include boundary scan?
Yes. The family includes boundary scan test options.[7]
Not publicly documented
The following facts about the J 750 EX are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the J 750 EX are on record.
Answerable by: OEM historical records or a trade-press announcement
The control-system platform and OS era of the J 750 EX are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the J 750 EX are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the J 750 EX is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly hosted manuals, SOPs, or datasheets for the J 750 EX are on record.
Answerable by: university cleanroom staff or an OEM application specialist
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (10)Every fact above is drawn from these public sources
- [1]Inventory photo
- [2]Inventory photo
- [3]Inventory photo
- [4]Inventory photo
- [5]Inventory photo
- [6]inventory listing
- [7]web.archive.org — teradyne.com (May 5, 2026)web.archive.org
- [8]Equipment inventory listing
- [9]Equipment inventory listing
- [10]Equipment inventory listing
Last updated Oct 9, 2026.
Compare with similar tools
View all →
The Advantest 93000 Smart Scale Tester is a semiconductor test system that includes a Z640 workstation and can be configured with STH or CTH thermal heads and various card types.
The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.
The LTX / Credence ASL 1000 is an integrated-circuit tester commonly configured with an Electroglas EG 4090 prober for 8-inch wafers.
