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Teradyne

A500

LegacyTest & ProbeTeradyneIntroduced Produced 1987–Teradyne A500 family
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The Teradyne A500 is an analog VLSI test system introduced in 1987. The A500 was the first analog VLSI test system from Teradyne. The A500 led the market in testing integrated devices that provided the interface between analog and digital data.[1]

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Produced

1987–

Node / era

Teradyne

What it is

The Teradyne A500 is an automatic test equipment (ATE) system introduced in 1987 as the first analog VLSI test system.[1]

The A500 was designed for testing integrated devices that provided the interface between analog and digital data.[1]

How it works

General reference — not yet source-verified

As an analog VLSI test system, the A500 applies electrical stimuli to a device under test (DUT) and measures its analog and mixed-signal responses.

Automatic test equipment of this class typically uses a test head that interfaces with the DUT via a probe card or test socket, along with a host controller running test programs.

Where it fits in the process flow

General reference — not yet source-verified

The A500 is used in semiconductor manufacturing to test individual integrated circuits, typically after wafer fabrication and before packaging.

The A500 sits between the fabrication and assembly stages, providing electrical verification that devices meet their analog and mixed-signal specifications before final packaging or system integration.

Applications

The A500 is used in the testing of analog and mixed-signal integrated circuits, such as data converters, operational amplifiers, and interface devices.[1]

What do the numbers mean?

Control & software1

Application
Testing integrated devices that provided the interface between analog and digital data[1]
Accurate?

Configuration & options3

Function
Analog VLSI test system[1]
Accurate?
Type
Analog VLSI test system[1]
Accurate?
Introduction year
1987[1]
Accurate?

Vintage & configurations

  1. 1987Production start[1]

    Teradyne introduced the first analog VLSI test system, the A500, in 1987.

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Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

When was the A500 introduced?

The A500 was introduced in 1987.[1]

What type of test system is the A500?

The A500 is an analog VLSI test system.[1]

What is the primary function of the A500?

The A500 tests integrated devices that provide the interface between analog and digital data.[1]

Not publicly documented

The following facts about the A500 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented variants, configuration options, or revision breakpoints of the A500 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the A500 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the A500 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • No publicly documented compatible parts, consumables, or accessories for the A500 are on record.

    Answerable by: an OEM parts catalog or a service engineer

  • No publicly hosted manuals, SOPs, or datasheets for the A500 are on record.

    Answerable by: university cleanroom staff or an OEM application specialist

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Sources & citations

Sources (1)Every fact above is drawn from these public sources
  1. [1]en.wikipedia.org — en.wikipedia.orgen.wikipedia.org
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Last updated Oct 7, 2026.

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