Bruker
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The Bruker Hysitron TI 980 TriboIndenter is a nanomechanical and nanotribological test system for advanced material characterization. The system can accommodate 12-inch wafers. The TI 980's base configuration includes quasi-static nanoindentation, dynamic nanoindentation, XPM mechanical property mapping, nanoscratch, nanowear, and in-situ scanning probe microscopy (SPM) imaging as standard capabilities. The TI 980 is designed to deliver quantitative measurements with ultrahigh performance and flexibility.[1][2]
The TI 980 employs a 2D capacitive transducer for precise force and displacement measurement. The system is controlled by the Performech II advanced control module, which provides fast feedback control and low noise floors for quantitative characterization. The TI 980 includes in-situ SPM imaging for high-resolution imaging of the sample surface before and after testing. The system also features XPM mechanical property mapping for high-speed, quantitative property maps, and nanoDMA III for nanoscale dynamic mechanical analysis.[1]
The TI 980 TriboIndenter is used for quantitative nanomechanical and nanotribological characterization of a wide range of materials. Applications include thin films, polymers, ceramics, and composites. The system's ability to perform high-speed property mapping (XPM) and dynamic mechanical analysis (nanoDMA III) makes it suitable for studying viscoelastic properties, wear resistance, and scratch behavior. The system can be configured with additional options such as electrochemical cells, environmental stages, and synchronized Raman spectroscopy for correlative studies.[1]
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Quasi-static nanoindentation, dynamic nanoindentation, XPM mechanical property mapping, nanoscratch, nanowear, and in-situ SPM imaging are standard testing modes.[1]
The TI 980 uses a 2D capacitive transducer.[1]
The TI 980 is controlled by the Performech II advanced control module.[1]
Yes, the TI 980 provides high-speed property mapping through XPM (XPM mechanical property mapping).[1]
Bruker's dynamic nanoindentation technique is called nanoDMA III (nanoscale dynamic mechanical analysis).[1]
The following facts about the TI 980 Characterization are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No specifications for the TI 980 Characterization are on record.
Answerable by: an OEM datasheet, a cleanroom equipment inventory, or an engineer who operated or installed it
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the TI 980 Characterization are on record.
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No publicly documented variants, configuration options, or revision breakpoints of the TI 980 Characterization are on record.
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The control-system platform and OS era of the TI 980 Characterization are not on record.
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No publicly documented failure modes or field errata for the TI 980 Characterization are on record.
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Last updated Oct 1, 2026.
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