Advantest

A semiconductor test system applies electrical test stimuli to a device under test and measures the device response against expected limits.
A tester class system uses instrument modules, control software, and a workstation interface to coordinate test sequencing, power delivery, and signal measurement during device characterization and production screening.
A semiconductor test system sits in the back-end portion of device manufacturing, where packaged or probe-stage devices are exercised before release to downstream assembly or qualification steps.
A test platform of this class is used to verify electrical behavior, isolate failing devices, and support production sorting during the manufacturing flow.
A semiconductor test system is used for electrical test of integrated circuits and other electronic devices.
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
No research found yet — worked with this tool? Share what you know.
The Advantest V 93000 CTH PS 1600 is a semiconductor test system.[1]
The following facts about the V 93000 CTH PS 1600 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the V 93000 CTH PS 1600 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the V 93000 CTH PS 1600 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the V 93000 CTH PS 1600 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the V 93000 CTH PS 1600 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the V 93000 CTH PS 1600 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Last updated Oct 5, 2026.
The KLA 1007 is a wafer prober manufactured by KLA.
The Electroglas 1034 Prober is a semiconductor wafer prober manufactured by Electroglas.