ADVANTEST
The ADVANTEST T5377 is an automated memory test system capable of simultaneously testing up to 256 DUTs per system at test speeds of up to 143/286 MHz in DDR mode. The T5377 is designed for wafer test of DRAMs and package test of Flash memory.[1]
The ADVANTEST T5377 is an automated test system designed for semiconductor memory devices.[1]
The T5377 is a memory tester that provides solutions for wafer test of DRAMs and package test of Flash memory.[1]
The system is fully compatible with its predecessor, the ADVANTEST T5375, allowing test programs and probe cards to be reused without modification.[1]
The T5377 is fitted with dual test heads, enabling it to test at two stations simultaneously.[1]
The system can simultaneously test up to 256 devices under test per system at test speeds of up to 143 or 286 MHz in DDR mode.[1]
The T5377 can capture fail data for large capacity memory devices, supporting functional testing and redundancy analysis for high density memory devices.[1]
An optional MRA4 ev2 redundancy analyzer can be selected for greater flexibility and efficiency in memory repair analysis.[1]
The system includes pattern generation via ALPG with configurable address and data lines, and supports parametric test units and programmable power supplies.[1]
The system supports both wafer-level testing of DRAMs and final package testing of Flash memory devices.[1]
The T5377 is used for testing DRAM, SDRAM, DDR devices, SRAM, Flash memories, Direct RDRAM, EPROM, and Masked ROM.[1]
The system targets high-volume production testing of memory devices, with its simultaneous test capability improving throughput.[1]
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The following facts about the T5377 Automated are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the T5377 Automated are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the T5377 Automated are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the T5377 Automated are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the T5377 Automated are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the T5377 Automated is not on record.
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Last updated Sep 24, 2026.
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