Comparison ledger
ADVANTEST T5377 Automated, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T5377 AutomatedADVANTEST | 1007KLA |
|---|---|---|
| OEM | ADVANTEST | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | ADVANTEST T5377 Automated | KLA 1007 |
| Specifications | ||
| Target devices | DRAM, SDRAM, DDR devices, SRAM,[1] | — |
| Test speed | 143/286 MHz (in DDR mode)[1] | — |
| Simultaneous testing | 256 devices (128 devices x 2 stations, in the case of x 8 or x 9 bits)[1] | — |
| Test heads | Up to 2 stations, High-voltage driver equipment, High-current driver equipment[1] | — |
| Pattern generation | ALPG; 18X, 18Y, 18D x 2 or 36D x 1[1] | — |
| Parametric test units | Up to 64 units/station[1] | — |
| Programmable power supplies | Up to 256 units/station[1] | — |
| Options | MRA4 (Memory Repair Analyzer) or AFM[1] | — |
| Manufacturer | — | KLA[2] |
| Model | — | 1007[2] |
| Description | — | Wafer Prober[2] |
| Wafer size | — | 150 mm[2] |
| Convertible to 8 inch wafer size | — | Yes[2] |
| Vintage | — | 01.06.1995[2] |
| Make | — | KLA[3] |
| Equipment type | — | Prober[3] |
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