Comparison ledger
KLA 1007, Tokyo Electron P 12 XLn+ Automatic Wafer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | P 12 XLn+ Automatic WaferTokyo Electron |
|---|---|---|
| OEM | KLA | Tokyo Electron |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Tokyo Electron P 12 |
| Specifications | ||
| Manufacturer | KLA[1] | Tokyo Electron (Tel)[5] |
| Model | 1007[1] | P 12 XLn+[5] |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | Tel[5] |
| Equipment type | Prober[2] | — |
| Configuration | — | Room/hot chuck[3] |
| Equipment Type | — | Automatic Wafer Prober[5] |
| Type | — | Automatic Wafer Prober[5] |
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