Waferpedia

Comparison ledger

1007versusSpectrum 8855

KLA 1007, Teradyne Spectrum 8855, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
1007KLA
OEMKLATeradyne
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA 1007Teradyne Spectrum
Specifications
ManufacturerKLA[1]Teradyne[3]
Model1007[1]Spectrum 8855[3]
DescriptionWafer Prober[1]—
Wafer size150 mm[1]—
Convertible to 8 inch wafer sizeYes[1]—
Vintage01.06.1995[1]2005[3]
MakeKLA[2]—
Equipment typeProber[2]Tester[3]
Power—5.50v, 200.00w[3]
Configuration—Hardware scan table[3]
5.50V power rail—200W[3]
24V power rail—50W[3]
52V power rail—200W[3]
VXI card cage—Extended for 3rd party C-sized VXI instruments[5]
Hardware scan table—Included[3]
VXI-MXI-2—Included[3]
Board configuration (asset 75212)—FIB/DeltaScan board, VP board (3), CC2a master and expander board (36)[3]
Board configuration (asset 75211)—High voltage PRISM board, VP board (2), CC2a master and expander board (24)[4]
Hardware—Hardware scan table; VXI-MXI-2; FIB / DeltaScan board; VP board (3); CC2a master and expander board (36)[3]
Test capabilities—Analog test; vectorless test; digital and mixed-signal vector test; boundary-scan test[5]
Device programming—In-line device programming of Flash, EEPROM, and FPGAs[5]
Card cage—Extended VXI card cage for integration of 3rd party C-sized VXI instruments[5]

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Sources (5)Every fact above is drawn from these public sources
  1. [1]fabsurplus.comfabsurplus.com
  2. [2]Equipment inventory listing
  3. [3]inventory listing
  4. [4]inventory listing
  5. [5]web.archive.orgweb.archive.org