Comparison ledger
KLA 1007, Seiko Epson NS 8040, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | NS 8040Seiko Epson |
|---|---|---|
| OEM | KLA | Seiko Epson |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Seiko Epson NS 8040 |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | 2007[4] |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Configuration | — | 200-240 VAC[3] |
| Power Supply | — | 200-240 VAC, single phase, 50/60 Hz[3] |
| Change Kits | — | 2 change kits (dual and quad sites)[4] |
| Power Requirements | — | 200-240 VAC, 50/60 Hz, Single Phase[4] |
| Test Sites | — | Dual and quad sites[4] |
| Voltage | — | 200-240 VAC[3] |
| Phase | — | Single phase[3] |
| Frequency | — | 50/60 Hz[3] |
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