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Comparison ledger

1.112 PSL Waferversus5200 XP Overlay Measurement

KLA 1.112 PSL Wafer, KLA 5200 XP Overlay Measurement, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
OEMKLAKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA 1.112 PSL WaferKLA 5200 XP Overlay Measurement
Specifications
ConfigurationNIST Traceable[1]50/60 Hz[3]
Wafer Size8 inch[1]—
NIST TraceableTrue[1]—
Compatible ToolsSurfscan 6xy0 and Sp1[2]—
Software Version—14.70.01[3]
Handler—x2 Open Cassette[3]
Wafer Sizes—4, 6, 8 inch[6]
Frequency—50/60 Hz[3]
Hard Drive—No HDD[4]
Chuck Type—Reflective Host Chuck[5]
Skine Material—Stainless Steel Skins[5]
Fan Box—Fan Box[5]
Printer—Sony Video Hard Copy Printer[5]
Power frequency—50/60 Hz[3]
Additional features (per unit)—Reflective Host Chuck, Stainless Steel Skins, Fan Box, Sony Video Hard Copy Printer[5]

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Sources (6)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]inventory listing
  4. [4]inventory listing
  5. [5]inventory listing
  6. [6]Equipment inventory listing