Comparison ledger
KLA 0035235-003 MMD Head, KLA Archer 10 Overlay Measurement, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 0035235-003 MMD Head | KLA Archer 10 Overlay Measurement |
| Specifications | ||
| Configuration | TSTD PCB ASSY, MMD MEAS HEAD[1] | — |
| Model | 0035235-003[1] | Archer 10[2] |
| Make | KLA[1] | — |
| Part Description | TSTD PCB ASSY, MMD MEAS HEAD[1] | — |
| Compatible System | KLA AIT-XP[1] | — |
| OEM | — | KLA[2] |
| Category | — | Metrology & Inspection[3] |
| Description | — | Overlay measurement[4] |
| Version | — | 300mm[4] |
| Automated overlay measurement module | — | Fully automated[5] |
| Wafer handling | — | 200mm dual open[5] |
| Wafer handler | — | 200mm dual port open wafer handler[6] |
| Software | — | Windows NT based SW and User Interface[5] |
| Computer | — | KLASS RS2 computer[6] |
| Computer upgrade | — | XP computer upgrade[6] |
| Integration software | — | KLASS station integration software[5] |
| Optical module | — | coherence probe interference microscope[5] |
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