Comparison ledger
Keysight M 8190 A Arbitrary Waveform, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | M 8190 A Arbitrary WaveformKeysight | 1007KLA |
|---|---|---|
| OEM | Keysight | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Keysight M 8190 A Arbitrary Waveform | KLA 1007 |
| Cited variants | — | |
| Specifications | ||
| Configuration | 12Gsa/S 14-Bit[2] | — |
| Manufacturer | Keysight[3] | KLA[5] |
| Model | M 8190 A[3] | 1007[5] |
| Category | Test & Probe[3] | — |
| Instrument type | arbitrary waveform generator[3] | — |
| Sample rate | 12 GSa/s[3] | — |
| Resolution | 14-bit[3] | — |
| Operation platform | Keysight AXIe mainframe[4] | — |
| Front-panel connector sensitivity | Sensitive to electrostatic discharge (ESD)[4] | — |
| Module configurations | 1-channel and 2-channel[1] | — |
| Control requirement | personal computer required for control[1] | — |
| Description | — | Wafer Prober[5] |
| Wafer size | — | 150 mm[5] |
| Convertible to 8 inch wafer size | — | Yes[5] |
| Vintage | — | 01.06.1995[5] |
| Make | — | KLA[6] |
| Equipment type | — | Prober[6] |
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