Comparison ledger
Chroma 3110, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 3110Chroma | 1007KLA |
|---|---|---|
| OEM | Chroma | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Chroma 3110 | KLA 1007 |
| Cited variants |
| — |
| Specifications | ||
| Configuration | Tri-temp[2] | — |
| Product type | Hybrid single-site test handler[3] | — |
| FT compatibility | FT compatible handler[3] | — |
| SLT compatibility | SLT compatible[3] | — |
| Thermal control | ATC tri-temp -40 to 150 ℃[3] | — |
| Optional IC test temperature range | -55 to 150 ℃, -70 to 150 ℃[3] | — |
| Auto tray loading/unloading | Auto tray loading/unloading and device sorting capability[3] | — |
| Device body capacity | Up to 120x120 mm[3] | — |
| Contact force | 80/180 kgf[3] | — |
| Optional contact force | 450 kgf[3] | — |
| Optional liquid submersion system | Available[3] | — |
| Applications | AI chips, automotive semiconductors, HPC related test, other advanced packaged semiconductors[3] | — |
| Manufacturer | — | KLA[4] |
| Model | — | 1007[4] |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
| Equipment type | — | Prober[5] |
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