Comparison ledger
Camtek Condor 202 M Defect, KLA 1.112 PSL Wafer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Condor 202 M DefectCamtek | |
|---|---|---|
| OEM | Camtek | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Camtek Condor 202 M Defect | KLA 1.112 PSL Wafer |
| Specifications | ||
| Configuration | Robot + Controller & Chuck[1] | NIST Traceable[4] |
| Type | defect inspection system[2] | — |
| Optics / imaging | controller board and optics removed[2] | — |
| Wafer handling | pre- and post-diced wafers up to 200 mm[3] | — |
| Supported unframed wafer sizes | 150 mm (6 in) and 200 mm (8 in)[3] | — |
| Wafer Size | — | 8 inch[4] |
| NIST Traceable | — | True[4] |
| Compatible Tools | — | Surfscan 6xy0 and Sp1[5] |
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