Comparison ledger
Applied Materials Complus 4 T, Applied Materials Complus 4 T Darkfield Defect, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Complus 4 TApplied Materials | Complus 4 T Darkfield DefectApplied Materials |
|---|---|---|
| OEM | Applied Materials | Applied Materials |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials Complus | Applied Materials Complus |
| Specifications | ||
| Configuration | Asyst L P2200 SMIF Load Ports[1] | Refurbished[2] |
| MC Workstation | SUN[1] | — |
| Software Version | 10.6 on WS[1] | — |
| IP Computer | 9.6[1] | — |
| Installed magnifications | GF 15, GF 20, GF 30, GF 40, GF 20 T , GF 30 T ,GF 40 T[1] | — |
| Custom Wafer Chuck | 12”/ 8” Standard[1] | — |
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