Comparison ledger
Applied Materials 0720 06060 Part, Bruker Rtespa 300, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | Rtespa 300Bruker |
|---|---|---|
| OEM | Applied Materials | Bruker |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Bruker Rtespa 300 |
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[1] | — |
| Model | — | Rtespa 300[2] |
| Equipment type | — | Prober[2] |
| Probe geometry | — | Rectangular[3] |
| Frequency, nominal | — | 300 kHz[3] |
| Frequency range | — | 200 to 400 kHz[3] |
| Spring constant, nominal | — | 40 N/m[3] |
| Spring constant range | — | 20 to 80 N/m[3] |
| Length, nominal | — | 125 µm[3] |
| Length range | — | 115 to 135 µm[3] |
| Width, nominal | — | 40 µm[3] |
| Width range | — | 38 to 42 µm[3] |
| Tip radius, nominal | — | 8 nm[3] |
| Tip radius, max | — | 12 nm[3] |
| Tip height | — | 10 to 15 µm[3] |
| Front angle | — | 15 ± 2°[3] |
| Back angle | — | 25 ± 2°[3] |
| Side angle | — | 17.5 ± 2°[3] |
| Cantilever material | — | 0.01 to 0.025 Ωcm antimony (n) doped Si[3] |
| Cantilever thickness, nominal | — | 3.4 µm[3] |
| Cantilever thickness range | — | 2.65 to 4.15 µm[3] |
| Back side coating | — | Reflective aluminum[3] |
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