Comparison ledger
Applied Materials 0010-03485 Magnet Assy, Chroma 3380 P, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03485 Magnet AssyApplied Materials | 3380 PChroma |
|---|---|---|
| OEM | Applied Materials | Chroma |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-03485 Magnet Assy | Chroma 3380 P |
| Specifications | ||
| Configuration | WP AL 300mm PVD[1] | — |
| OEM | Applied Materials[1] | — |
| Model | 0010-03485[1] | — |
| Description | MAGNET ASSY, WP AL 300MM PVD[2] | — |
| Process | PVD[3] | — |
| Wafer size | 300mm[4] | — |
| Version | Spares[4] | — |
| Part Number | 0010-03485[1] | — |
| Manufacturer | Applied Materials[1] | — |
| Process Type | PVD (Physical Vapor Deposition)[1] | — |
| Application (Material) | Aluminum (AL)[1] | — |
| Wafer Diameter (associated) | 300 mm[1] | — |
| Clock rate | — | 50/100 MHz[5] |
| Data rate | — | 50/100 Mbps[5] |
| I/O pins | — | 1024 I/O pins (max. 1280 I/O pins)[5] |
| Parallel testing | — | Up to 1024 sites parallel testing[5] |
| Pattern memory | — | 32/64/128 pattern memory[5] |
| Capture memory per pin | — | 16M capture memory per pin[5] |
| VI source | — | Various VI source[5] |
| Hardware architecture | — | Flexible hardware architecture with interchangeable I/O, VI, and ADDA[5] |
| Trim/match function | — | Real parallel trim/match function[5] |
| Measurement unit | — | Time and frequency measurement unit (TFMU)[5] |
| STDF tools support | — | Supported[5] |
| Test program/pattern converter | — | Supported; J750, D10, S50/100, E320, SC312, V7, TRI-6036, etc.[5] |
| AD/DA test | — | Option[5] |
| SCAN test | — | Option; max. 2G M/chain[5] |
| ALPG test | — | Option for embedded memory[5] |
| Programming language | — | CRAFT C/C++[5] |
| Operating environment | — | User-friendly Windows 7 environment[5] |
| Design | — | All-in-one design for test head only[5] |
| Product type | — | VLSI test system[5] |
| STDF support | — | STDF tools support[5] |