Comparison ledger
Applied Materials 0010-03254 E Chuck, Thermawave Opti-Probe 2600, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03254 E ChuckApplied Materials | Opti-Probe 2600Thermawave |
|---|---|---|
| OEM | Applied Materials | Thermawave |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | — | — |
| Cited variants | — | |
| Specifications | ||
| Wafer Size Compatibility | — | 4- to 8-inches[2] |
| Laser | — | 675nm thermoelectrically cooled diode laser[2] |
| Spectrometry lamp | — | 450 to 840 nm tungsten halogen lamp[2] |
| BPR range | — | thick dielectric films > 500A[2] |
| BPE range | — | thin dielectric films < 500A[2] |
| Resolution | — | 150nm[2] |
| Product type | — | Thin Film Measurement System[3] |
| Version | — | 200[3] |