Waferpedia

Comparison ledger

E8364Bversus1034

Agilent E8364B, Electroglas 1034, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
E8364BAgilent
1034Electroglas
OEMAgilentElectroglas
CategoryTest & ProbeTest & Probe
Wafer size2"—
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control systemWindows 10—
Generation——
FamilyAgilent E8364BElectroglas 1034
Specifications
Instrument typevector network analyzer[1]—
Probe-station configurationHFTL 50-GHz Small-Signal Probe Station[1]—
Associated probe stationCascade Summit 9600 probe station[1]—
MicroscopeMitutoyo 378-134-4 microscope with long working distance and built-in TV camera[1]—
Thermal chuck6-inch-diameter microchamber and thermal chuck (−50 to 200 °C)[1]—
Thermal chuck controllerTemptronic TPO3000 ThermoChuck system[1]—
RF signal path componentstwo flexible 2.4-mm-diameter coaxial cables, two Agilent 11612V bias tees, two 2.4-mm semflexible cables, and two 2.4-mm probes[1]—
DC bias instrumentAgilent 4156C precision semiconductor parameter analyzer[1]—
Control softwareKeysight IC-CAP on Windows 10[1]—
ManufacturerAgilent Technologies / Keysight Technologies[2]—
Instrument modelE8364B[2]—
Product familyPNA Series Microwave Network Analyzers[3]—
Frequency range10 MHz to 50 GHz[4]—

Plan your fab

Building a Test & Probe process? Get a complete equipment list.

Open the fab equipment planner →
Sources (4)Every fact above is drawn from these public sources
  1. [1]cnf.cornell.educnf.cornell.edu
  2. [2]sine.ni.comsine.ni.com
  3. [3]keysight.comkeysight.com
  4. [4]atecorp.comatecorp.com