Comparison ledger
Advantest 93000 SOC C 200 e, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 93000 SOC C 200 eAdvantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest 93000 | KLA 1007 |
| Specifications | ||
| Configuration | XW4400 *1[1] | — |
| Configuration (Asset #150848) | XW4400 *1, C400e/C200e *32, GPDSP *4, 2004 Vintage[1] | — |
| Configuration (Asset #150847) | XW8400 *1, C400e/C200e *46, MCA *2, MSDPS *5, 2005 Vintage[2] | — |
| Configuration (Asset #150846) | XW8400 *1, C400e/C200e *32, MCA *2, MSDPS *5, 2004 Vintage[3] | — |
| Manufacturer | — | KLA[4] |
| Model | — | 1007[4] |
| Description | — | Wafer Prober[4] |
| Wafer size | — | 150 mm[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
| Equipment type | — | Prober[5] |
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