Comparison ledger
KLA 1007, Signatone WL-1160, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | WL-1160Signatone |
|---|---|---|
| OEM | KLA | Signatone |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | 150mm |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Signatone WL-1160 |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Product type | — | RF / Microwave Probe Station[3] |
| Application focus | — | high-frequency, high-power, and millimeter wave applications[3] |
| Operating characteristic | — | non-resonant operation is critical[3] |
| Chuck sizes | — | 150mm and 200mm chucks[3] |
| Calibration chuck | — | Independent calibration chuck located adjacent to the main chuck[3] |
| Calibration chuck material | — | Non-resonant polymer[3] |
| Microscope stage | — | 2" x 2" microscope stage[3] |
| Microscope compatibility | — | Supports most StereoZoom and high-powered microscopes[3] |
| Platform sharing | — | Uses the same stable platform as the S-1160 multipurpose probe station[3] |
| X-Y motion control | — | 150mm & 200mm manual X-Y motion control[3] |
| Microscope stage control | — | 50mm X 50mm microscope stage control[3] |
| Height control | — | Separate contact / separate and platen height control[3] |
| Z motion | — | Up to 30mm Z motion control of platen[3] |
| Micropositioner capacity | — | Holds up to four S-96MW microwave micropositioners[3] |
| Standard manifolds | — | Vacuum and DC manifolds standard[3] |
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