Comparison ledger
KLA 1007, LTX-Credence ASLx, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | ASLxLTX-Credence |
|---|---|---|
| OEM | KLA | LTX-Credence |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | LTX-Credence ASLx |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | — |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | 2014[3] |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Configuration | — | Keyboard / monitor[3] |
| Slot 1 | — | Source Sync Step Bus II Interface (SSB1)[3] |
| Slot 3 | — | MUX (Metal relays)[3] |
| Slot 15 | — | HVS[3] |
| Slot 24/20 | — | Pocket MUX[3] |
| Slot PP | — | Pocket Power Board[3] |
| Machine type | — | Tester[3] |
| Instrument adaptor boards | — | 6[3] |
| Board compatibility | — | Standard ASL-1000 boards[3] |
| Agilent meter | — | One tester with Agilent Meter; one tester without[3] |
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