Waferpedia

Comparison ledger

1.112 PSL WaferversusVanox

KLA 1.112 PSL Wafer, Olympus Vanox, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
VanoxOlympus
OEMKLAOlympus
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA 1.112 PSL WaferOlympus Vanox
Specifications
ConfigurationNIST Traceable[1]—
Wafer Size8 inch[1]—
NIST TraceableTrue[1]—
Compatible ToolsSurfscan 6xy0 and Sp1[2]—
Platform type—Universal research microscope[3]
System design—Modular building-block system of interchangeable accessories[3]
Observation tube—Binocular tube with photo tube[3]
Observation tube inclination—30°[4]
Interpupillary distance adjustment range—56 mm to 75 mm[4]
Diopter adjustment range—-8 to +2 diop.[4]
Revolving nosepiece—Five-objective opening nosepiece; sextuple nosepiece optionally available[5]
Stage—170 mm x 172 mm stage with 300° rotation and 76 mm x 52 mm cross travel[5]
Standard condenser—NA 1.40 achromat/aplanatic condenser[5]
Light source—12V 100W halogen bulb[5]
Power transformer—Built into the base and adjustable from 0 to 12 volts[5]
Photomicrographic camera system—PM-10AD universal, fully modular multiformat camera system with automatic controls[5]

Plan your fab

Building a Metrology & Inspection process? Get a complete equipment list.

Open the fab equipment planner →
Sources (5)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]waferpedia.comwaferpedia.com
  3. [3]alanwood.netalanwood.net
  4. [4]microscopeinternational.commicroscopeinternational.com
  5. [5]alanwood.netalanwood.net