Comparison ledger
Applied Materials 0010-22161 High EFF RF Match, KLA Archer 10, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-22161 High EFF RF MatchApplied Materials | Archer 10KLA |
|---|---|---|
| OEM | Applied Materials | KLA |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-22161 High EFF RF Match | KLA Archer 10 |
| Cited variants | — |
|
| Specifications | ||
| Make | Applied Materials[2] | — |
| Model | 0010-22161[2] | Archer 10[5] |
| Description | HTESC PH 1 REV A[3] | — |
| Condition | Used[3] | — |
| Stock Number | BM6628[3] | — |
| Wafer Size | — | 200mm[4] |
| Wafer Handling | — | 200mm dual open wafer handler[4] |
| Measurement Technology | — | Coherence probe interference microscope[4] |
| Software | — | Windows NT based[4] |
| Integration Software | — | KLA Stepper Setup (KLASS) station integration software[4] |
| User Interface | — | 19-inch LCD screen[4] |
| Network | — | Network ready[4] |
| OEM | — | KLA[5] |
| Category | — | Metrology & Inspection[1] |
| Wafer handling | — | 200mm dual port open wafer handler[1] |
| Overlay measurement module | — | Fully automated overlay measurement module[4] |
| Optics | — | Coherence probe interference microscope[4] |
| Computer software | — | Windows NT based software and user interface[4] |
| Computer interface | — | Integrated user interface[4] |
| Display | — | 19" LCD screen[4] |
| Storage media | — | 3.5 inch floppy drive and CD ROM drive[4] |
| Connectivity | — | Network ready[4] |
| Communications | — | SEC's communication[4] |
| Software version | — | 5.6[1] |
| Computer upgrade | — | XP computer upgrade[1] |
| Computer | — | KLASS RS2 computer[1] |
| Configuration options | — | AMS, Digitizer, LINNIK, PDA, PZT-P-Z feedback[1] |