Comparison ledger
Applied Materials 0010-22161 High EFF RF Match, Keysight 4156 C Precision Semiconductor Parameter Analyzer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-22161 High EFF RF MatchApplied Materials | |
|---|---|---|
| OEM | Applied Materials | Keysight |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-22161 High EFF RF Match | Keysight 4156 C Precision Semiconductor Parameter Analyzer |
| Cited variants | — | |
| Specifications | ||
| Make | Applied Materials[2] | Keysight / Agilent[4] |
| Model | 0010-22161[2] | 4156 C[4] |
| Description | HTESC PH 1 REV A[3] | — |
| Condition | Used[3] | — |
| Stock Number | BM6628[3] | — |
| Measurement modes | — | DC, pulsed force/measure, stress force, voltage/current sweep, and sampling (time domain) measurements[1] |
| Sweep types | — | linear or logarithmic; VAR1 primary sweep, VAR2 subordinate sweep, and VAR1' synchronous sweep[1] |
| Sampling modes | — | linear, log, and thinned-out[1] |
| Maximum sampling points | — | 10,001 (linear)[1] |
| Stress time set range | — | 500 μs to 31,536,000 s (365 days)[1] |
| Desktop software | — | Desktop EasyEXPERT standard edition[1] |
| model | — | 4156 C Precision Semiconductor Parameter Analyzer[4] |
| device type | — | precision semiconductor parameter analyzer[4] |
| measurement types | — | DC and quasi-static measurements[1] |
| sweep measurement types | — | basic sweep, subordinate sweep, synchronous sweep, and pulse sweep[5] |
| sampling measurement modes | — | linear, log, and thinned-out[1] |
| measurement units | — | SMU, VSU, VMU, PGU, and GNDU[1] |