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0010-18024 Pyrometer AssemblyversusSurfscan SP 1 Unpatterned Wafer Inspector

Applied Materials 0010-18024 Pyrometer Assembly, KLA Surfscan SP 1 Unpatterned Wafer Inspector, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
OEMApplied MaterialsKLA
CategoryMetrology & InspectionMetrology & Inspection
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyApplied Materials 0010-18024 Pyrometer AssemblyKLA Surfscan SP 1 Unpatterned Wafer Inspector
Cited variants—
Specifications
ConfigurationCapable of working on Applied Materials Radiance[4]—
Substrate Supported Sizes—300 mm, 200 mm, 150 mm (vacuum handling); 300 mm or 200 mm only for Edge Handling and BSIM configurations[1]
Defect Sensitivity (frontside, polished bare Si, >95% capture rate)—>0.083 µm diameter PSL sphere equivalent with normal illumination; >0.060 µm with oblique illumination[1]
Defect Sensitivity (SP1 DLS variant)—0.050 µm defect sensitivity on polished bare silicon[2]
Laser Source (SP1 DLS)—Argon Ion Laser (488 nm)[2]
Throughput (200 mm, Vacuum Handling)—125 wph (Frontside, @0.08 µm HT); 40 wph (Frontside, @0.06 µm HS)[1]
Throughput (300 mm, Vacuum Handling)—90 wph (Frontside, @0.08 µm HT); 22 wph (Frontside, @0.06 µm HS)[1]
Dimensions (Standard Handler)—Height: 183 cm (72"); Width: 117 cm (46"); Depth: 122 cm (48")[1]
Weight (Instrument)—~360 kg (800 lb)[1]
Operating System—Windows NT 4.0[1]
System Power Rating (SP1 TB1)—240 VAC, Single Phase[1]
Contamination (Frontside)—≤0.001 particles (≥0.09 µm)/cm²/pass[1]
Supported Substrate Sizes—150mm, 200mm, 300mm (vacuum handling); 300mm or 200mm only for Edge Handling and BSIM configurations[1]
Laser Source—Argon Ion Laser (488 nm)[5]
System Power Rating—240 VAC, Single Phase[1]
Throughput (200mm, Vacuum Handling, Frontside)—125 wph @0.08 µm HT; 40 wph @0.06 µm HS[1]
Throughput (300mm, Vacuum Handling, Frontside)—90 wph @0.08 µm HT; 22 wph @0.06 µm HS[1]
Dimensions—Height: 183 cm (72"); Width: 117 cm (46"); Depth: 122 cm (48")[1]
Weight—~360 kg (800 lb)[1]
Contamination—≤0.001 particles (≥0.09 µm)/cm²/pass frontside[1]
Software Version—3.5[1]

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Sources (5)Every fact above is drawn from these public sources
  1. [1]rawbw.comrawbw.com
  2. [2]classoneequipment.comclassoneequipment.com
  3. [3]metrologyequipmentservices.commetrologyequipmentservices.com
  4. [4]inventory listing
  5. [5]waferpedia.comwaferpedia.com