Comparison ledger
Applied Materials 0010-18024 Pyrometer Assembly, JEOL JEM-ARM300F, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-18024 Pyrometer AssemblyApplied Materials | JEM-ARM300FJEOL |
|---|---|---|
| OEM | Applied Materials | JEOL |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | 2014 first demonstrated · 2014 First demonstration of 45 pm STEM resolution |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-18024 Pyrometer Assembly | JEOL JEM-ARM300F |
| Specifications | ||
| Configuration | Capable of working on Applied Materials Radiance[1] | — |
| instrument type | — | atomic transmission electron microscope[2] |
| microscope voltage | — | 300 kV[2] |
| STEM resolution | — | 45 pm[2] |
| Accelerating voltage | — | 300 kV[2] |
| Type | — | Transmission electron microscope (TEM/STEM)[2] |
| Demonstrated resolution (STEM) | — | 45 pm[2] |
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