Comparison ledger
Applied Materials 0010-03485 Magnet Assy, Applied Materials UVision 3, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03485 Magnet AssyApplied Materials | UVision 3Applied Materials |
|---|---|---|
| OEM | Applied Materials | Applied Materials |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | 2007– |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-03485 Magnet Assy | Applied Materials UVision 3 |
| Specifications | ||
| Configuration | WP AL 300mm PVD[1] | — |
| OEM | Applied Materials[1] | — |
| Model | 0010-03485[1] | — |
| Description | MAGNET ASSY, WP AL 300MM PVD[2] | — |
| Process | PVD[3] | — |
| Wafer size | 300mm[4] | — |
| Version | Spares[4] | — |
| Part Number | 0010-03485[1] | — |
| Manufacturer | Applied Materials[1] | — |
| Process Type | PVD (Physical Vapor Deposition)[1] | — |
| Application (Material) | Aluminum (AL)[1] | — |
| Wafer Diameter (associated) | 300 mm[1] | — |
| Type | — | DUV Brightfield wafer inspection tool[5] |
| Throughput improvement | — | 40% faster than any competitive brightfield inspection tool[5] |
| Defect sensitivity | — | 20 nm[5] |
| Laser architecture | — | Multi-beam DUV laser (triples the number of laser beams)[5] |
| Imaging modes | — | Two new imaging modes extending sensitivity to 20 nm[5] |
| Defect classification | — | Flexible automatic defect classification engine[5] |