Waferpedia

Comparison ledger

0010-03254 E Chuckversus4PP-TypeG

Applied Materials 0010-03254 E Chuck, KLA 4PP-TypeG, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
0010-03254 E ChuckApplied Materials
OEMApplied MaterialsKLA
Category——
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
Family—KLA 4PP-TypeG
Specifications
Product family—4PP (four-point probe)[1]
Tip Spacing—0.6 mm[2]
Tip Radius—100 µm[2]
Contact Force—100 gm[2]
Material—230-0919[2]
Compatible Measurement Systems—Filmetrics R50, Filmetrics R54[2]
Sources (2)Every fact above is drawn from these public sources
  1. [1]store.kla-instruments.comstore.kla-instruments.com
  2. [2]store.kla-instruments.comstore.kla-instruments.com