Comparison ledger
Agilent 11980 A, SCIEX ZENO TOF 7600, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 11980 AAgilent | ZENO TOF 7600SCIEX |
|---|---|---|
| OEM | Agilent | SCIEX |
| Category | Precision Optics | Precision Optics |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | 1999 QSTAR introduction · 1999 model line evolution |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent 11980 A | SCIEX ZENO TOF 7600 |
| Specifications | ||
| Wavelength Range | 1250-1600 nm[1] | — |
| manufacturer | — | SCIEX[2] |
| instrument type | — | quadrupole/time-of-flight (QTOF)[2] |
| lineage | — | evolved from the QSTAR instrument introduced in 1999[2] |
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