Comparison ledger
Advantest V 93000 C (2 CC) DUT Test Head, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | V 93000 C (2 CC) DUT Test HeadAdvantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest V 93000 | KLA 1007 |
| Cited variants | — | |
| Specifications | ||
| Configuration | Rev 004[3] | — |
| Digital Cards | HSM8G x2, Digital pPogos: HD256 x2[3] | — |
| DPS Cards | DCS-DPS32 x1, DCS-VI32 x1, (Missing E5810 LAN/GPIB Gateway)[3] | — |
| Digital cards | HSM8G x2, digital pogos: HD256 x2[4] | — |
| DPS cards | DCS-VI32 x1[4] | — |
| Revision | 004 / 005[3] | — |
| Digital Pogos | HD256 x2 (Rev 004), x3 (Rev 005)[2] | — |
| CTH Engineering Cart | Included[3] | — |
| Control Workstation | Included[3] | — |
| OEM | Advantest[3] | — |
| Model | V 93000 C (2 CC)[3] | 1007[5] |
| Equipment type | DUT Test Head[3] | Prober[6] |
| Digital pogos | HD256 x2[3] | — |
| Included items | CTH engineering cart; control workstation[3] | — |
| Manufacturer | — | KLA[5] |
| Description | — | Wafer Prober[5] |
| Wafer size | — | 150 mm[5] |
| Convertible to 8 inch wafer size | — | Yes[5] |
| Vintage | — | 01.06.1995[5] |
| Make | — | KLA[6] |
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