Waferpedia

Comparison ledger

T 6371versus0720 06060 Part

Advantest T 6371, Applied Materials 0720 06060 Part, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
T 6371Advantest
0720 06060 PartApplied Materials
OEMAdvantestApplied Materials
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyAdvantest T 6371Applied Materials 0720 06060 Part
Cited variants—
Specifications
Phase3 Phase / 4 Wire[2]—
Configuration200/208 Vac[2]Contact Pin 24-20 Awg Crimp Gold Flash[4]
TC_UNITTC7[2]—
TH1 I/O256Ch[2]—
LCD768Ch[2]—
PPS 20V8Ch[2]—
PPS40V8Ch[2]—
RVS32Ch[2]—
Power3 Phase / 4 Wire - 200/208 Vac - 50/60 Hz[2]—
SystemTC_UNIT: TC7 - 125/250MHz[2]—
I/O channelsTH1 I/O : 256Ch[2]—
Per Pin Power Supply (PPS) 20V8Ch[2]—
Per Pin Power Supply (PPS) 40V8Ch[2]—
Analog driver pins (maximum)1280 pins[1]—
Digital driver pins (maximum)256 pins[1]—
Maximum test frequency125/250MHz[1]—
SoftwareViewpoint LCD[1]—
OEMAdvantest[2]—
ModelT 6371[2]—
Equipment typeTester[2]—
System typeLCD driver test system[1]—
Target devicesLCD driver IC, MCU, MPU[1]—
Maximum number of measuring devices4[1]—
Maximum frequency125/250MHz[1]—

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Sources (4)Every fact above is drawn from these public sources
  1. [1]web.archive.orgweb.archive.org
  2. [2]inventory listing
  3. [3]inventory listing
  4. [4]inventory listing