Comparison ledger
Advantest T 5585, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | T 5585Advantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest T 5585 | KLA 1007 |
| Cited variants |
| — |
| Specifications | ||
| Configuration | HDD and Software included[2] | — |
| Target devices | SDRAM, DDR-SDRAM, SSRAM[1] | — |
| Test frequency | 250/500 MHz (DDR mode)[1] | — |
| Test timing accuracy | ±400 ps[1] | — |
| Max simultaneous test count | 256 (128 × 2 stations × 8/9 bit)[1] | — |
| DC test units | 32 (standard), 64 (maximum)[1] | — |
| Programmable power supplies | 64 (standard), 192 (maximum)[1] | — |
| Pattern generator | ALPG X16, Y16, D18×2[1] | — |
| Options | DBM, AFM, PM[1] | — |
| Wafer size | 8 inch[3] | 150 mm[4] |
| Manufacturer | — | KLA[4] |
| Model | — | 1007[4] |
| Description | — | Wafer Prober[4] |
| Convertible to 8 inch wafer size | — | Yes[4] |
| Vintage | — | 01.06.1995[4] |
| Make | — | KLA[5] |
| Equipment type | — | Prober[5] |
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