Comparison ledger
Advantest M6541AD Test handler with Cold Option, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest M6541AD Test handler with Cold Option | KLA 1007 |
| Specifications | ||
| Attachments | 1 Files[1] | — |
| Low temperature range | -55°C to 125°C[1] | — |
| Includes | Device Cooling Unit QTY 1, Test Head Positioner 1 QTY 1, LN2 Valve QTY 1, Signal Tower QTY 1, Keyboard (Handy + EMO) QTY 1, HEX Socket RL Cover QTY 1, Stocker QTY 1, Cooling LN2 Valve QTY 1, Heat Sinking - 1 Set, Heat Sinking Unit QTY 1, Heat Sinking Out CBL QTY 1, Dry Air Test Head Unit - 1 Set, Dry Air Test Head Unit QTY 1, Dry Air Test Head Unit (Accessories) QTY 1[1] | — |
| Manufacturer | — | KLA[2] |
| Model | — | 1007[2] |
| Description | — | Wafer Prober[2] |
| Wafer size | — | 150 mm[2] |
| Convertible to 8 inch wafer size | — | Yes[2] |
| Vintage | — | 01.06.1995[2] |
| Make | — | KLA[3] |
| Equipment type | — | Prober[3] |
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