Waferpedia

Comparison ledger

M 6242versus0720 06060 Part

Advantest M 6242, Applied Materials 0720 06060 Part, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
M 6242Advantest
0720 06060 PartApplied Materials
OEMAdvantestApplied Materials
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyAdvantest M 6242Applied Materials 0720 06060 Part
Specifications
Configuration50 / 60 Hz[1]Contact Pin 24-20 Awg Crimp Gold Flash[2]
Target PackagesBGA, CSP, TSOP 1[1]—
Simultaneous TestingUp to 512 devices[1]—
Throughput42,300 devices per hour[1]—
Temperature Range-40°C to 125°C, -55°C to 125°C (optional)[1]—
Match PlateAdvantest Standard Type[1]—

Plan your fab

Building a Test & Probe process? Get a complete equipment list.

Open the fab equipment planner →
Sources (2)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing